DSpace at KSIT Library: Analysis and Design of Resilient VLSI Circuits

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Please use this identifier to cite or link to this item: http://hdl.handle.net/123456789/142

Title:	Analysis and Design of Resilient VLSI Circuits
Other Titles:	Mitigating Soft Errors and Process Variations
Authors:	Rajesh Garg Sunil P. Khatri •
Issue Date:	2010
Publisher:	Springer
Series/Report no.:	;223
URI:	http://hdl.handle.net/123456789/142
ISBN:	978-1-4419-0930-5
Appears in Collections:	VLSI Design

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